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Semiconductor Fabrication: From Sand to Chip · Module 10

A Complete CMOS Process

This module puts the steps together and follows a wafer through the fab from start to finish.

What you will learn

  • The order of the main steps in a CMOS process
  • What self-alignment means and why it is so useful
  • How modern transistors changed the flow
  • How a fab keeps hundreds of steps under control

In plain language

The earlier modules covered one kind of step at a time. A real chip is built by repeating those steps in a careful order. A layer is deposited, a pattern is printed, the layer is etched or the silicon is doped, the resist is stripped, the wafer is cleaned and measured, and the cycle begins again.

A leading-edge wafer passes through many hundreds of steps and spends about three months in the fab. The order matters. Each hot step moves the dopants that are already in place, each etch must stop on the right layer, and each pattern must line up with those beneath it.

Image
Flow chart of eight steps in a CMOS process: starting wafer, isolation trenches, wells, gate stack, source and drain, contacts, metal layers, and test and package

ANNLab, University of Arizona

Figure 1. The main stages of a CMOS process. The front end builds the transistors and the back end wires them together.

Core lesson

Step 1. The starting wafer

The process begins with a polished p-type wafer with a (100) surface, as described in Module 2. It is cleaned and given a thin protective oxide.

Step 2. Isolation

Neighboring transistors must not affect each other. Shallow trenches are etched into the silicon around the area of each transistor, filled with deposited oxide, and polished flat. This is called shallow trench isolation.

Step 3. Wells

A CMOS chip needs both n-channel and p-channel transistors on the same wafer. An n-channel transistor must sit in p-type silicon and a p-channel transistor in n-type silicon. Two masked implants create these regions, called the p-well and the n-well, and an anneal activates them.

Step 4. The gate stack

The gate insulator is formed, and the gate material is deposited over it. The gate pattern is then printed and etched. This is the most demanding pattern in the whole process, because the width of the gate line sets the channel length of the transistor. The etch must cut through the gate material and stop on an insulator only a few atoms thick, which calls for very high selectivity.

Step 5. Source and drain

The source and the drain are implanted with the gate already in place. The gate blocks the ions, so the doped regions line up with the edges of the gate without any separate alignment. This idea is called self-alignment, and it is one of the most useful ideas in chip making, because it removes an alignment error that could not otherwise be avoided.

In practice the step has three parts. A shallow, light implant forms the regions next to the channel. A film is then deposited evenly over the gate and etched straight down, which leaves a thin wall of insulator, called a spacer, on each side of the gate. A heavier implant then forms the main source and drain regions a small distance from the channel. A rapid anneal activates the dopants. The n-channel and the p-channel transistors receive their implants separately, each with its own mask.

Step 6. Contacts

Silicide is formed on the source, the drain, and the gate. An insulator is deposited and polished, contact holes are etched down to the silicide, and the holes are filled with tungsten.

Step 7. Metal layers

The copper wiring is built layer by layer with the damascene process from Module 9. Each layer needs its own lithography, etching, deposition, plating, and polishing steps.

Step 8. Test and package

A final protective layer is added and opened over the pads. The chips are tested on the wafer, cut apart, packaged, and tested again.

What changed in modern processes

The flow above describes a classic flat transistor. Today’s processes keep the same logic and add to it. The gate that is patterned first is now a temporary stand-in. After the source and drain anneal, it is removed and replaced with a high-k insulator and a metal gate, which could not have survived that anneal. Silicon mixed with germanium is grown in the source and drain to strain the channel and speed up the carriers.

In a FinFET, thin vertical fins of silicon are etched first, and the gate wraps over them. In the newest transistors, alternating crystal layers are grown and etched into fins, and one of the two materials is then removed by a selective etch to leave thin sheets of silicon. ALD wraps the gate insulator and the gate metal around each sheet. Every one of these changes is built from the unit steps in this course.

Keeping the flow under control

Process integration engineers own the flow as a whole. They decide the order of steps and make sure each step leaves the wafer ready for the next. Film thickness, line width, and alignment are measured after critical steps. Small test structures between the chips are measured electrically. The results are tracked with statistical methods, so a tool that begins to drift is caught before it damages many wafers.

Going deeper

These sections add the equations behind the core lesson, each with a worked example. They assume first-year algebra and can be skipped without losing the thread of the course.

The number of lithography masks is a rough measure of the cost and the complexity of a process.

Worked example

A simple CMOS flow needs one mask for isolation, two for the wells, one for the gate, two for the shallow implants, two for the main source and drain implants, one for the contacts, and one for the first metal layer. That makes ten. Each further metal layer needs two masks, one for the vias and one for the wires. A process with six metal layers therefore needs 10 + 5 × 2 = 20 masks, plus one to open the pads, for a total of 21. Leading-edge processes use several times as many.

Because dopants move in every hot step, a flow is arranged so that the hottest steps come first and the temperature limit falls as the wafer advances. Well anneals and oxidations at 1,000 °C or more come early. The source and drain anneal is hot but lasts only seconds. Silicide forms at a few hundred degrees. Everything after the first metal layer stays at or below about 400 °C.

Worked example

Module 6 showed that boron moves about 4 nm in a 10 second anneal at 1,000 °C and about 74 nm in one hour. A source and drain edge that must stay within a few nanometers of the gate edge could not survive an hour-long step at that temperature. Any such step has to come before the source and drain are formed.

The spacer on the side of the gate has a width set by the thickness of the deposited film, not by lithography. Film thickness can be controlled far more finely than a printed line.

Worked example

A 30 nm film deposited evenly over the gate and etched straight down leaves a spacer close to 30 nm wide. The same idea is used to double the density of lines. If lines are printed with a spacing of 80 nm from center to center, and spacers are formed on both sides of each line, removing the original lines leaves spacers with a spacing of 40 nm.

Check your understanding

Try each question before opening the answer. The last question uses the Going deeper material.

It places an insulating oxide between neighboring transistors, so that current cannot flow from one to the other through the silicon.

The gate itself blocks the implant, so the doped regions begin exactly at the edges of the gate. No separate alignment step is needed, and no alignment error can occur.

Dopants move whenever the wafer is hot. Hot steps placed late would spread out the shallow doped regions and would damage the metal wiring.

The high-k insulator and the metal gate would be damaged by the anneal. A temporary gate is used to align the source and drain and is replaced afterward.

10 + 8 × 2 = 26 masks, plus one to open the pads, for a total of 27.

Key terms

  • Process flow. The complete ordered list of steps used to make a chip
  • Shallow trench isolation. Oxide-filled trenches that separate neighboring transistors
  • Well. A doped region that provides the right background for one type of transistor
  • Self-alignment. Using a structure already on the wafer as the mask for the next step
  • Spacer. A thin wall of insulator left on the side of the gate
  • Replacement metal gate. A process in which a temporary gate is removed and replaced with the final gate
  • Strained silicon. Silicon whose atoms are slightly stretched or compressed to speed up carriers
  • Process integration. The work of combining individual steps into a flow that works as a whole
  • Critical dimension. The width of the smallest feature in a layer, such as the gate line
  • Statistical process control. Tracking measurements over time to catch a process that is drifting

In the fab

Process integration engineers, manufacturing technicians, and yield engineers work with the whole flow. They need a working knowledge of every step in this course, which is why broad training matters in this industry.

Further reading

J. D. Plummer and P. B. Griffin, Integrated Circuit Fabrication: Science and Technology, Cambridge University Press. The authors offer a prepublication version that is free to read on the Stanford book site (opens in a new tab).

To carry out a simplified version of such a flow yourself, see the Semiconductor Processing Laboratory Online Modules on our Training page.

Previous: Module 9Course homeNext: Module 11, Beyond Silicon

Created by Prof. Zafer Mutlu, ANNLab, University of Arizona.