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Semiconductor Fabrication: From Sand to Chip · Module 7

Etching

Etching removes material wherever the resist pattern leaves it uncovered. It turns a printed image into a real structure.

What you will learn

  • The difference between wet etching and plasma etching
  • What isotropic and anisotropic etching mean
  • Why selectivity decides whether an etch can be used
  • How ions and reactive gases work together in a plasma etch

In plain language

After lithography, the resist on the wafer is a stencil. Etching removes the film in the open areas of that stencil. It can be done in a liquid chemical bath, which is called wet etching, or with an electrically charged gas called a plasma, which is called dry etching.

Wet etching is simple and gentle, but the liquid eats sideways as fast as it eats downward, so it cannot cut narrow lines. In a plasma etch, charged particles are driven straight down onto the wafer, so the cut goes down and not sideways. Nearly all the fine patterns on a chip are etched with plasma.

Image
Two cross-sections comparing an isotropic etch, which undercuts the mask with curved sidewalls, and an anisotropic etch, which gives vertical sidewalls

ANNLab, University of Arizona

Figure 1. An isotropic etch undercuts the mask. An anisotropic etch copies the mask with vertical sidewalls.

Core lesson

Four numbers that describe an etch

  • Etch rate is how fast the film is removed, usually in nanometers per minute.
  • Selectivity is the etch rate of the film divided by the etch rate of another material, such as the mask or the layer beneath.
  • Anisotropy describes how much faster the etch goes down than sideways.
  • Uniformity describes how evenly the etch runs across the wafer.

An etch must stop on the layer beneath the film without damaging it. High selectivity to that layer makes this possible. High selectivity to the resist lets a thin resist survive a long etch.

Wet etching

Each film has its own etchant. Silicon dioxide is etched in hydrofluoric acid, which barely attacks silicon. Silicon nitride is etched in hot phosphoric acid. Aluminum is etched in a mixture of phosphoric, acetic, and nitric acids.

These etches are isotropic, which means they proceed at the same rate in every direction. The film is undercut beneath the mask by about as much as its own thickness. That is acceptable when the features are much wider than the film is thick, and it rules out wet etching for fine lines. Wet chemistry is still used widely for cleaning, for removing whole films, and for some micromechanical devices. Silicon etched in potassium hydroxide is a special case, because the etch rate depends strongly on the crystal plane and gives flat, angled walls.

Plasma etching

A plasma is made by applying radio-frequency power to a gas at low pressure. The power strips electrons from some molecules and breaks others apart. The result is a mixture of ions, which carry a charge, and radicals, which are neutral and very reactive. Fluorine radicals from a gas such as carbon tetrafluoride react with silicon to form silicon tetrafluoride, which is itself a gas and is pumped away. A plasma etch only works if the product is a gas. Copper forms no suitable gas, which is why copper wiring is made in a different way, as Module 9 explains.

Radicals alone etch in all directions. Ions alone knock atoms off the surface slowly and with little selectivity. Together they etch far faster than either does alone, and only where the ions strike. Ions arrive from straight above, so they hit the bottom of a feature and miss its sidewalls. Etching that uses both is called reactive ion etching.

Many recipes add a gas that deposits a thin protective film on all surfaces. The ions clear this film from the bottom while it stays on the sidewalls, which keeps the walls vertical.

Typical plasma etch gases.
FilmCommon gases
Silicon and polysiliconChlorine, hydrogen bromide, sulfur hexafluoride
Silicon dioxideFluorocarbons such as CF4, CHF3, C4F8
AluminumChlorine, boron trichloride
Photoresist (removal)Oxygen

Limits and newer methods

Narrow, deep features etch more slowly than wide ones, because ions and radicals have trouble reaching the bottom. Energetic ions can also damage the layers they uncover. Tools watch the light given off by the plasma to detect the moment the film has cleared, which is called the endpoint.

For very deep holes, one method alternates short etch steps with short steps that coat the sidewalls. It can cut hundreds of micrometers into silicon with vertical walls. For the most delicate features, atomic layer etching removes one atomic layer in each cycle.

Going deeper

These sections add the equations behind the core lesson, each with a worked example. They assume first-year algebra and can be skipped without losing the thread of the course.

Etch rate varies a little across a wafer, so engineers etch somewhat longer than the nominal time to be sure the film clears everywhere. During this over-etch, the layer beneath is exposed.

Worked example

A 200 nm oxide film is etched at 100 nm per minute with 20% over-etch. The total time is 2.4 minutes. The selectivity to the resist is 4, so the resist is removed at 25 nm per minute and loses 60 nm. The selectivity to the silicon beneath is 20, so silicon is removed at 5 nm per minute during the 0.4 minutes of over-etch and loses 2 nm.

A = 1 − (sideways etch rate / downward etch rate)

A value of 0 is fully isotropic and a value of 1 is perfectly vertical.

Worked example

A trench is etched 500 nm deep, and the film is undercut by 25 nm on each side. The anisotropy is 1 − 25 / 500 = 0.95.

Ions travel straight only if they do not collide with gas molecules on the way to the wafer. The average distance between collisions, the mean free path, is roughly 5 cm divided by the pressure in millitorr.

Worked example

At 10 millitorr the mean free path is about 0.5 cm. The ions are accelerated across a thin layer above the wafer that is a millimeter or less thick, so nearly all of them cross it without a collision and arrive straight down. At 1 torr the mean free path is only 0.005 cm, and the ions would be scattered in many directions.

Check your understanding

Try each question before opening the answer. The last question uses the Going deeper material.

An isotropic etch removes material at the same rate in all directions and undercuts the mask. An anisotropic etch removes material mainly downward and leaves vertical sidewalls.

A wet etch undercuts the mask by about the thickness of the film on each side. If the line is not much wider than the film is thick, the undercut removes it.

Selectivity is the ratio of the etch rate of the film to the etch rate of another material. High selectivity lets the etch stop on the layer beneath and lets the mask last through the etch.

The radicals supply the chemical reaction that turns the film into a gas. The ions arrive from straight above and speed up that reaction at the bottom of the feature, which makes the etch directional.

The etch takes 2 minutes. The resist is removed at 50 nm per minute, so 100 nm of resist is lost.

Key terms

  • Etch rate. The thickness of film removed per unit time
  • Selectivity. The ratio of the etch rates of two materials in the same etch
  • Isotropic. Proceeding at the same rate in every direction
  • Anisotropic. Proceeding faster in one direction, usually straight down
  • Undercut. Removal of film beneath the edge of the mask
  • Plasma. A gas in which some atoms or molecules have been ionized
  • Radical. A neutral, highly reactive fragment of a molecule
  • Reactive ion etching. Plasma etching that combines chemical reaction with ion impact
  • Endpoint. The moment an etch has cleared the film
  • Atomic layer etching. Etching that removes one atomic layer per cycle

In the fab

Etch engineers tune gas mixtures, pressure, and power to get the right profile. Equipment technicians keep the plasma chambers clean and matched, since a small change in a chamber wall can change the etch.

Further reading

J. D. Plummer and P. B. Griffin, Integrated Circuit Fabrication: Science and Technology, Cambridge University Press. The authors offer a prepublication version that is free to read on the Stanford book site (opens in a new tab).

Previous: Module 6Course homeNext: Module 8, Thin-Film Deposition

Created by Prof. Zafer Mutlu, ANNLab, University of Arizona.